The use of spectroscopic techniques to investigate the structure and properties of surfaces or interfaces, including X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM) and atomic force microscopy (AFM).
The use of spectroscopic techniques to investigate the structure and properties of surfaces or interfaces, including X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy (STM) and atomic force microscopy (AFM).